Particle Analysis

Anderson Materials Evaluation uses many analytical capabilities to provide particle analysis.  Charles Anderson has analyzed particles since 1981 and this laboratory has been doing particle analysis since 1995.  Let us examine some of the particle analysis capabilities of this laboratory:

XPS or ESCA Particle Analysis:

  • Determines the surface elemental composition for all elements except hydrogen and helium in the outer 10 nm of a surface
  • Determines the chemical phases present both quantitatively and for complex phases
  • Contrasts surface chemistry with interior chemistry either by argon ion sputtering or by fresh grinding to complement XRF, EDS, or FTIR-ATR analyses of the near-surface of about 100 times greater depth
  • Surface chemistry is often very different from the bulk chemistry and is highly dependent upon processing and environmental exposure
  • Surface chemistry dominates in reactions with other materials
  • Contaminant detection and identification on surfaces
  • Determine causes of wetting and adhesive bonding problems
  • Determine degree of surface hydration
  • Determine cause of sintering problems
  • Identify fill materials of plastics, composite materials, paints, primers, sealants, thermal compounds, and adhesives after burning off polymer matrix with TGA

SEM/EDS Particle Analysis:

  • Views surface morphology
  • Measures particle sizes
  • Provides evidence for uniformity or not
  • Images agglomerated particles well
  • Examine rough surfaces
  • Determines elemental composition for elements beyond sodium in the periodic table, though it sees carbon, nitrogen, and oxygen 

XRF or X-Ray Fluorescence Spectroscopy Particle Analysis:

  • Quantitative analysis of elements carbon and heavier
  • Very high sensitivity of detection for all elements carbon and heavier
  • Measures composition to depths from about 0.5 micrometers to 1.5 micrometers
  • Allows the contrast of chemistry in the particle as a whole with the immediate surface chemistry determined by XPS 

LIBS or Laser-Induced Breakdown Spectroscopy:

  • Determines the elemental composition of a single particle provided that the particle has a cross-sectional area of at least 10 micrometers diameter and a depth of at least 6 micrometers
  • Determines elemental differences in different areas of a larger particle

Optical Microscopy Particle Analysis:

  • Checks color uniformity for many particles
  • Checks light transmission and reflection uniformity
  • Suggests the presence of multiple chemistries and sometimes the nature of the differences
  • Color information often implies the chemistry of the particle
  • Our Keyence 7000N provides great depth of field for viewing particles of many sizes or deposited on non-flat surfaces at high magnification
  • Determine particle sizes and shapes
  • Determine the distribution of particles in transparent media such as glass and some ceramics and plastics

TGA or Thermogravimetric Particle Analysis:

  • Determines if particles decompose and, if so, at what temperature
  • Often allows quantitative chemical analysis by weight
  • Measure weight of inorganic particles in a polymer matrix, such as plastics, composite materials, paints, primers, sealants, thermal compounds, and adhesives by burning off polymer matrix in air or oxygen
  • Prepares inorganic particles from plastics, etc., for XPS analysis and SEM or optical microscopy

DSC or Differential Scanning Calorimetry Particle Analysis:

  • Measures particle melting temperature and heat of fusion
  • Determines temperature and energy of reaction between particles and another material
  • Measures particle oxidation temperature and energies
  • Measures heat absorption by five retardant fill materials such as aluminum trihydrate or magnesium hydroxide
  • Detects particle structural phase changes
  • Measures the specific heat
  • Measures glass transition temperature of polymer particles

FTIR or Infrared Spectroscopy Particle Analysis:

  • Identifies organic material in particle form or on particles, whether a surface treatment or a contaminant
  • Determines whether carbonates, phosphates, nitrates, nitrites, sulfates, or water are present
  • Identifies organic binders used to consolidate particles in abrasive wheels, cutting discs, brake pads, and other applied materials

Ceramic Powder Identification on Floor Tile

XPS Analysis of Feldspar Mineral Particles

FTIR Analysis of Products Formed from Overheating a Silicone Material

Sample in XPS for Analysis
Sample in XPS for Analysis