Comprehensive Analytical and Engineering Support Services

At Anderson Materials Evaluation, we offer a wide range of analytical services and support for engineering materials, chemicals, and products. Our expertise spans various techniques and industries, ensuring precise and reliable results for all your testing needs.


Analytical Services

  • X-ray Photoelectron Spectroscopy (XPS or ESCA)
    • Small-Spot Analysis: Including depth profiling, heating, and residual gas analysis (RGA MS).
  • Gas Chromatography – Mass Spectroscopy (GC-MS)
    • Volatile Compounds Analysis: Using solvent extraction or headspace SPME.
  • Infrared Spectroscopy (FTIR) Materials Analysis
  • Scanning Electron Microscopy (SEM)
    • High-Resolution Imaging: With digital imaging, Robinson backscatter electron imaging, and energy-dispersive X-ray (EDX) spectroscopy.
  • Thermal Analysis
    • Techniques: Differential Scanning Calorimetry (DSC), Thermogravimetry (TGA), and Thermomechanical Analysis (TMA).
  • Elemental Analysis
    • Elemental Analysis: Determines elemental composition with high sensitivity and accuracy, utilizing methods like XPS, XRF, EDX, and LIBS for diverse applications.
  • Wavelength-Dispersive X-ray Fluorescence (WD-XRF)
    • Elemental Analysis: High-precision measurement of elemental concentrations.
  • UV-Vis Spectrophotometry
    • Reflectivity Analysis: Specular and diffuse reflectivity measurements.
  • Metallographic Optical Microscopy/Metallography
    • Material Examination: Detailed study of metallographic structures.
  • Mechanical Testing
    • Hardness Testing: Shore A and Shore D measurements.
  • Cross-Section Analysis
    • Detailed Inspection: Analysis of internal structures.
  • Coating and Film Thickness Measurements
    • Methods: Using SEM, optical microscopy, and XPS depth profiling.
  • Silicone Contamination Measurement
    • Detection: For facilities and ovens.
    • Cleaning and Effectiveness Analysis: CO2 snow jet, plasma cleaning, UV, and solvent cleaning.
  • Electrical Conductivity Testing
    • Electrical Resistivity & Conductivity Testing: Measurement of electrical resistivity and conductivity
  • Optical Microscopy with Laser-Induced Breakdown Spectroscopy (LIBS)
    • Surface Profilometry and Roughness: Measures surface topography and roughness for detailed surface characterization.
  • Fractography, Failure Analysis and Forensic Engineering
  • Contact Angle Measurements
  • Density and Porosity Measurements
  • Consulting and Expert Witness, Experimental Design, Quality Control and Assurance
  • Research and Development
  • Materials Verifications and Specifications
  • Counterfeit Product Detection and Proof

Engineering Materials, Chemicals, and Products Support


Contact Us About Our Analytical and Engineering Support Services

Have questions or need more information about our services? Contact us today to discuss your materials problem or analytical service requirements.

Nickel sulfide (NiS) inclusions (often caused by contaminants in manufacturing) in Glass sample that failed.
Nickel sulfide (NiS) inclusions in a glass sample that failed. NiS inclusions are often caused by contaminants during manufacturing.